High resolution X-ray diffractometry and topography by Brian K. Tanner, D.K. Bowen

High resolution X-ray diffractometry and topography



Download High resolution X-ray diffractometry and topography




High resolution X-ray diffractometry and topography Brian K. Tanner, D.K. Bowen
Language: English
Page: 278
Format: pdf
ISBN: 0850667585, 9780850667585
Publisher: CRC Press

The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research.

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